Basler ace 2 a2A1280-125umSWIR Camera

Highlights

The Basler ace 2 a2A1280-125umSWIR is a compact monochrome SWIR area scan camera designed for machine vision applications that require imaging beyond the visible spectrum. Featuring the Sony IMX990 InGaAs global shutter sensor, this camera captures both visible and short-wave infrared light across a 0.4 µm to 1.7 µm spectral range. As a result, inspection systems can detect material differences, subsurface features, moisture variation, contamination, and alignment details that may not be visible with standard cameras.

With 1.3 MP resolution, 1280 x 1024 image size, 5 µm pixels, and a USB 3.0 interface, the a2A1280-125umSWIR provides a strong balance of SWIR sensitivity, speed, and integration flexibility. Its 125 fps frame rate, global shutter performance, C-mount lens interface, USB3 Vision support, and compact ace 2 housing make it well suited for automated inspection, semiconductor, food, agriculture, and OEM machine vision applications.

Features

• Sony IMX990 InGaAs sensor provides SWIR imaging with excellent sensitivity in the visible and short-wave infrared range.
• Visible + SWIR spectral response captures wavelengths from 0.4 µm to 1.7 µm for inspection tasks beyond standard visible-light imaging.
• 1.3 MP resolution with a 1280 x 1024 image size provides practical image detail for compact SWIR inspection systems.
• Up to 125 fps supports fast image acquisition for industrial inspection and automated quality control systems.
• Global shutter sensor helps reduce motion distortion when capturing moving objects or synchronized production processes.
• USB 3.0 interface provides high-speed image transfer and practical integration for industrial machine vision systems.
• USB3 Vision support helps simplify camera integration with compatible machine vision software and hardware platforms.
• 5 µm x 5 µm pixels support strong SWIR sensitivity in a compact 1/2″ sensor format.
• C-mount lens interface supports integration with compatible machine vision and SWIR lenses.
• Hardware and software triggering allow precise image capture timing in automated inspection systems.
• Compact ace 2 housing makes the camera suitable for space-limited industrial vision installations.
• Basler pylon software support simplifies camera configuration, image acquisition, and system integration.

Applications

• Semiconductor wafer alignment and inspection
• Subsurface defect detection
• Hidden feature and alignment mark inspection
• Food and agricultural product inspection
• Moisture and material contrast inspection
• Bruise and pressure point detection in produce
• Contamination detection
• Fill level inspection through suitable container materials
• Industrial quality control
• Automated optical inspection
• Research, laboratory imaging, and OEM vision system integration