JAI Wave WAA-1300-GE-TEC Camera

Highlights

The JAI Wave WAA-1300-GE-TEC is a 1.3 MP monochrome Visible + SWIR area scan camera designed for industrial inspection, sorting, measurement, and material-analysis applications. Its Sony IMX990 InGaAs sensor delivers a native resolution of 1280 × 1024 pixels at frame rates of up to 90 fps.

A GigE Vision interface supports reliable image transmission and straightforward system integration, while the sensor’s approximately 400–1700 nm spectral response captures information across both the visible and short-wave infrared ranges. Integrated thermoelectric cooling stabilizes the sensor temperature to reduce dark noise and support consistent image quality.

Features

• 1.3 MP resolution with a native image size of 1280 × 1024 pixels
• Sony IMX990 InGaAs sensor with global-shutter operation
• Up to 90 fps acquisition at full resolution
• Visible + SWIR sensitivity covering approximately 400–1700 nm
• 5.0 µm square pixels on a 1/2-inch optical-format sensor
• GigE Vision connectivity for efficient industrial image transmission
• Monochrome output formats supporting Mono8, Mono10, and Mono12
• Integrated thermoelectric cooling for sensor-temperature stability and reduced dark noise
• Region-of-interest control for acquiring selected areas of the sensor
• Binning and image-flip functions for flexible image acquisition and orientation
• Image correction functions including flat-field correction and defective-pixel correction
• Image adjustment tools including black level, gamma, brightness, contrast, and LUT controls
• Temporal and spatial denoise with programmable image-enhancement control
• Standard C-mount for use with compatible machine-vision and SWIR lenses

Applications

• Fruit and vegetable sorting and grading
• Food quality inspection
• Moisture and ripeness analysis
• Semiconductor and wafer inspection
• Semiconductor alignment
• Plastic heat-seal inspection
• Laser beam profiling and alignment
• Recycling and waste sorting
• Material identification and classification
• Industrial defect detection