Basler racer 2 TDI r2T16416-500cm Line Scan Camera

Highlights

The Basler racer 2 TDI r2T16416-500cm is a high-performance monochrome TDI line scan camera designed for demanding machine vision applications that require very high speed, high sensitivity, and wide-field continuous inspection. Featuring the Gpixel GLT5016BSI monochrome BSI CMOS TDI sensor, this racer 2 XL camera delivers 16k resolution with 256 TDI stages and a line rate of up to 500 kHz.

With 16416 pixel horizontal resolution, 5 µm pixels, and a CoaXPress-over-Fiber interface with 4x CXP-25 bandwidth, the r2T16416-500cm is built for high-end inspection systems that generate very large image data volumes. Its QSFP28 optical connection, M90x1 lens mount, 100 Gbps interface bandwidth, and compatibility with Basler’s imaFlex 2 Dual 100 frame grabber make it well suited for wafer inspection, semiconductor inspection, battery cell inspection, flat panel inspection, PCB inspection, and other advanced inline quality control applications.

Features

• Gpixel GLT5016BSI monochrome BSI CMOS TDI sensor provides high-speed, high-sensitivity imaging for demanding industrial inspection tasks.
• 16k TDI line scan resolution with 16416 horizontal pixels supports detailed inspection across wide materials, substrates, and production lines.
• 256 TDI stages increase signal collection for brighter, higher-contrast images in high-speed inspection environments.
• Up to 500 kHz line rate supports very fast continuous acquisition for high-throughput inline inspection systems.
• CoaXPress-over-Fiber interface provides high-bandwidth optical data transfer for demanding TDI vision systems.
• 4x CXP-25 / 100 Gbps bandwidth supports the data throughput required for 16k TDI imaging at very high line rates.
• QSFP28 optical connection enables high-speed fiber connectivity with electromagnetic compatibility and long cable-distance capability.
• 5 µm x 5 µm pixels provide strong sensitivity and detailed spatial sampling for precision inspection.
• Monochrome TDI output supports applications where sensitivity, contrast, and fine defect detection are more important than color information.
• M90x1 lens mount supports integration with suitable high-resolution line scan lenses for large-format TDI imaging.
• Hardware trigger, software trigger, and free-run operation support flexible synchronization in advanced line scan inspection systems.
• Basler Framegrabber SDK and imaFlex 2 Dual 100 compatibility support acquisition, preprocessing, and integration in high-performance TDI vision systems.

Applications

• Wafer inspection
• Semiconductor inspection
• Battery cell inspection
• Battery electrode and separator foil inspection
• Flat panel display inspection
• PCB inspection
• High-speed web inspection
• Surface defect detection on continuous materials
• High-throughput inline quality control
• Advanced factory automation inspection
• OEM TDI vision system integration

Related Line Scan Camera Models

Looking for a standard non-TDI 16k CoaXPress line scan camera? See the Basler r2L16384-120cm 16k mono CoaXPress line scan camera.