Basler ace 2 a2A2840-67g5mUV Camera
Highlights
The Basler ace 2 a2A2840-67g5mUV is a compact monochrome UV area scan camera designed for machine vision applications that require imaging beyond the visible spectrum. Featuring the Sony IMX487-AAMJ-C UV CMOS global shutter sensor, this camera captures ultraviolet image data in the 0.2 µm to 0.4 µm spectral range. As a result, inspection systems can detect fine surface features, material differences, security markings, and defects that may not be visible with standard cameras.
With 8.1 MP resolution, a 2840 x 2840 image size, 2.74 µm pixels, and a 5GigE interface, the a2A2840-67g5mUV provides high-resolution UV imaging with higher Ethernet bandwidth than standard GigE models. Its 67 fps frame rate, global shutter performance, C-mount lens interface, GigE Vision support, and compact ace 2 housing make it well suited for wafer inspection, material sorting, security inspection, solar inspection, electronics inspection, and OEM machine vision applications.
Features
- Sony IMX487-AAMJ-C UV CMOS sensor provides high-resolution ultraviolet imaging for demanding industrial inspection tasks.
- UV spectral response captures wavelengths from 0.2 µm to 0.4 µm for inspection tasks beyond standard visible-light imaging.
- 8.1 MP resolution with a 2840 x 2840 image size provides detailed image capture for fine-feature inspection.
- Up to 67 fps supports fast UV image acquisition for industrial inspection and automated quality control systems.
- Global shutter sensor helps reduce motion distortion when capturing moving objects or synchronized production processes.
- 5GigE interface provides higher Ethernet bandwidth than standard GigE for demanding machine vision applications.
- GigE Vision 2.0 support helps simplify camera integration with compatible machine vision software and hardware platforms.
- 2.74 µm x 2.74 µm pixels support detailed UV image capture in a compact 2/3″ sensor format.
- C-mount lens interface supports integration with compatible UV-capable machine vision lenses.
- Hardware and software triggering allow precise image capture timing in automated inspection systems.
- Basler pylon software support simplifies camera configuration, image acquisition, and system integration.
- Compression Beyond and Pixel Beyond provide in-camera features for more efficient bandwidth use and flexible pixel scaling.
Applications
- Wafer surface inspection
- Semiconductor inspection
- Material sorting
- Plastic and glass differentiation
- Security feature inspection
- Banknote and ID document inspection
- Special printing ink inspection
- Solar cell and photovoltaic inspection
- Surface scratch and crack detection
- Electronics inspection
- Industrial quality control
- Research, laboratory imaging, and OEM vision system integration
Looking for a different interface? Compare this 5GigE model with the GigE a2A2840-14gmUV or the USB 3.0 a2A2840-48umUV.
Product Specifications




