Basler ace 2 a2A1280-80gmSWIR Camera

Highlights

The Basler ace 2 a2A1280-80gmSWIR is a compact monochrome SWIR area scan camera designed for machine vision applications that require imaging beyond the visible spectrum. Featuring the Sony IMX990 InGaAs global shutter sensor, this camera captures both visible and short-wave infrared light across a 0.4 µm to 1.7 µm spectral range. As a result, inspection systems can detect material differences, subsurface features, moisture variation, contamination, and alignment details that may not be visible with standard cameras.

With 1.3 MP resolution, 1280 x 1024 image size, 5 µm pixels, and a GigE interface, the a2A1280-80gmSWIR provides reliable SWIR imaging with straightforward Ethernet-based integration. Its 80 fps frame rate, global shutter performance, C-mount lens interface, GigE Vision support, PoE capability, and compact ace 2 housing make it well suited for automated inspection, semiconductor, food, agriculture, and OEM machine vision applications.

Features

• Sony IMX990 InGaAs sensor provides SWIR imaging with excellent sensitivity in the visible and short-wave infrared range.
• Visible + SWIR spectral response captures wavelengths from 0.4 µm to 1.7 µm for inspection tasks beyond standard visible-light imaging.
• 1.3 MP resolution with a 1280 x 1024 image size provides practical image detail for compact SWIR inspection systems.
• Up to 80 fps supports fast image acquisition for industrial inspection and automated quality control systems.
• Global shutter sensor helps reduce motion distortion when capturing moving objects or synchronized production processes.
• GigE interface provides Ethernet-based image transfer for practical machine vision integration.
• GigE Vision support helps simplify camera integration with compatible machine vision software and hardware platforms.
• Power over Ethernet allows camera power and data transmission through the Ethernet connection for simplified cabling.
• 5 µm x 5 µm pixels support strong SWIR sensitivity in a compact 1/2″ sensor format.
• C-mount lens interface supports integration with compatible machine vision and SWIR lenses.
• Hardware and software triggering allow precise image capture timing in automated inspection systems.
• Basler pylon software support simplifies camera configuration, image acquisition, and system integration.

Applications

• Semiconductor wafer alignment and inspection
• Subsurface defect detection
• Hidden feature and alignment mark inspection
• Food and agricultural product inspection
• Moisture and material contrast inspection
• Bruise and pressure point detection in produce
• Contamination detection
• Fill level inspection through suitable container materials
• Industrial quality control
• Automated optical inspection
• Research, laboratory imaging, and OEM vision system integration